مؤتمر
Tradeoffs of current drive vs. short-channel effect in deep-submicrometer bulk and SOI MOSFETs
| العنوان: | Tradeoffs of current drive vs. short-channel effect in deep-submicrometer bulk and SOI MOSFETs |
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| المؤلفون: | Su, L.T., Hang Hu, Jacobs, J.B., Sherony, M.J., Wei, A., Antoniadis, D.A. |
| المصدر: | Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :649-652 1994 |
| Relation: | Proceedings of 1994 IEEE International Electron Devices Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780321111 9780780321113 |
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| تدمد: | 01631918 |
| DOI: | 10.1109/IEDM.1994.383326 |