دورية أكاديمية
Test function embedding algorithms with application to interconnected finite state machines
| العنوان: | Test function embedding algorithms with application to interconnected finite state machines |
|---|---|
| المؤلفون: | Kanjilal, S., Chakradhar, S.T., Agrawal, V.D. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 14(9):1115-1127 Sep, 1995 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
|---|---|
| DOI: | 10.1109/43.406713 |