مؤتمر
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells
| العنوان: | Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells |
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| المؤلفون: | Rusu, C., Bougerol, A., Anghel, L., Weulerse, C., Buard, N., Benhammadi, S., Renaud, N., Hubert, G., Wrobel, F., Carriere, T., Gaillard, R. |
| المصدر: | 13th IEEE International On-Line Testing Symposium (IOLTS 2007) On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International. :137-145 Jul, 2007 |
| Relation: | 13th IEEE International On-Line Testing Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769529186 9780769529189 |
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| تدمد: | 19429398 19429401 |
| DOI: | 10.1109/IOLTS.2007.46 |