A New Interference Phenomenon in Sub-60nm Nitride-Based Flash Memory

التفاصيل البيبلوغرافية
العنوان: A New Interference Phenomenon in Sub-60nm Nitride-Based Flash Memory
المؤلفون: Chang, Y.W., Wu, G.W., Chen, P.C., Chen, C.H., Yang, I.C., Chin, C.Y., Huang, I.J., Tsai, W.J., Lu, T.C., Lu, W.P., Chen, K.C., Lu, C.Y.
المصدر: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2007 22nd IEEE. :81-82 Aug, 2007
Relation: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424407524
9781424407521
1424407532
9781424407538
تدمد:2159483X
21594864
DOI:10.1109/NVSMW.2007.4290590