Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range

التفاصيل البيبلوغرافية
العنوان: Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range
المؤلفون: Derkach, V.N., Tarapov, S.I., Nedukh, S.V., Anbinderis, T., Laurinavicius, A.
المصدر: 2007 International Kharkov Symposium Physics and Engrg. of Millimeter and Sub-Millimeter Waves (MSMW) Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on. 2:830-832 Jun, 2007
Relation: 2007 International Kharkov Symposium Physics and Engrg. of Millimeter and Sub-Millimeter Waves
قاعدة البيانات: IEEE Xplore Digital Library