Total Internal Reflection Microscopy for Surface Plasmon Scattering of a Single Cu Nanowire

التفاصيل البيبلوغرافية
العنوان: Total Internal Reflection Microscopy for Surface Plasmon Scattering of a Single Cu Nanowire
المؤلفون: Yim, Sang-Youp, Ahn, Hong-Gyu, Kim, Dae-Geun, Je, Koo-Chul, Ju, Honglyoul, Choi, Moohyun, Park, Chang Woo, Park, Seung-Han
المصدر: 2007 Conference on Lasers and Electro-Optics - Pacific Rim Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on. :1-2 Aug, 2007
Relation: 2007 Conference on Lasers and Electro-Optics - Pacific Rim
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424411733
9781424411740
DOI:10.1109/CLEOPR.2007.4391204