مؤتمر
On-chip timing uncertainty measurements on IBM microprocessors
| العنوان: | On-chip timing uncertainty measurements on IBM microprocessors |
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| المؤلفون: | Franch, R., Restle, P., James, N., Huott, W., Friedrich, J., Dixon, R., Weitzel, S., Van Goor, K., Salem, G. |
| المصدر: | 2007 IEEE International Test Conference Test Conference, 2007. ITC 2007. IEEE International. :1-7 Oct, 2007 |
| Relation: | 2007 IEEE International Test Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424411276 9781424411283 |
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| تدمد: | 10893539 23782250 |
| DOI: | 10.1109/TEST.2007.4437560 |