مؤتمر
Bit error rate in NAND Flash memories
| العنوان: | Bit error rate in NAND Flash memories |
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| المؤلفون: | Mielke, Neal, Marquart, Todd, Ning Wu, Kessenich, Jeff, Belgal, Hanmant, Schares, Eric, Trivedi, Falgun, Goodness, Evan, Nevill, Leland R. |
| المصدر: | 2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :9-19 Apr, 2008 |
| Relation: | 2008 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424420490 9781424420506 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/RELPHY.2008.4558857 |