دورية أكاديمية
Observation and characterization of near-interface oxide traps with C-V techniques
| العنوان: | Observation and characterization of near-interface oxide traps with C-V techniques |
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| المؤلفون: | Cohen, N.L., Paulsen, R.E., White, M.H. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 42(11):2004-2009 Nov, 1995 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/16.469410 |