مؤتمر
Channel BER Measurement for a 5.8Gb/s/pin unidirectional differential I/O for DRAM application
العنوان: | Channel BER Measurement for a 5.8Gb/s/pin unidirectional differential I/O for DRAM application |
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المؤلفون: | Hoeju Chung, Youngchan Jang, Youngdon Choi, Park, Hwanwook, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Park, Moonsook, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim |
المصدر: | 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :29-32 Nov, 2008 |
Relation: | 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424426041 9781424426058 |
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DOI: | 10.1109/ASSCC.2008.4708721 |