مؤتمر
Detection of abnormalities and electricity theft using genetic Support Vector Machines
العنوان: | Detection of abnormalities and electricity theft using genetic Support Vector Machines |
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المؤلفون: | Nagi, J., Yap, K. S., Tiong, S. K., Ahmed, S. K., Mohammad, A. M. |
المصدر: | TENCON 2008 - 2008 IEEE Region 10 Conference. :1-6 Nov, 2008 |
Relation: | TENCON 2008 - 2008 IEEE Region 10 Conference (TENCON) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424424085 9781424424092 |
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تدمد: | 21593442 21593450 |
DOI: | 10.1109/TENCON.2008.4766403 |