مؤتمر
Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module
| العنوان: | Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module |
|---|---|
| المؤلفون: | Fellner, Johannes, Schatzberger, Gregor, Wiesner, Andreas |
| المصدر: | 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :118-120 Oct, 2008 |
| Relation: | 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder كن أول من يترك تعليقا!