مؤتمر
A comprehensive and comparative study of interface and bulk characteristics of nMOSETs with la-incorporated high-k dielectrics
| العنوان: | A comprehensive and comparative study of interface and bulk characteristics of nMOSETs with la-incorporated high-k dielectrics |
|---|---|
| المؤلفون: | Won-Ho Choi, Hyuk-Min Kwon, In-Shik Han, Tae-Gyu Goo, Min-Ki Na, Chang Yong Kang, Gennadi Bersuker, Byoung Hun Lee, Yoon-Ha Jeong, Hi-Deok Lee, Jammy, R. |
| المصدر: | 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008 |
| Relation: | 2008 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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