مؤتمر
Inhibition of neutron irradiation on oxidation stacking faults in the surface of Si wafer
العنوان: | Inhibition of neutron irradiation on oxidation stacking faults in the surface of Si wafer |
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المؤلفون: | Yangxian Li, Yulin Ju, Caichi Liu, Yuesheng Xu, Hongmei Wang, Junzhong Cao |
المصدر: | Proceedings of 4th International Conference on Solid-State and IC Technology Solid-state and integrated circuit technology Solid-State and Integrated Circuit Technology, 1995 4th International Conference on. :586-588 1995 |
Relation: | Proceedings of 4th International Conference on Solid-State and IC Technology |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780330625 9780780330627 |
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DOI: | 10.1109/ICSICT.1995.503359 |