Correspondence relation between [N-H]/[Si-H] ratio and their optical loss properties in silicon nitride thin films

التفاصيل البيبلوغرافية
العنوان: Correspondence relation between [N-H]/[Si-H] ratio and their optical loss properties in silicon nitride thin films
المؤلفون: Mao, S.C., Xu, Y.L., Lu, G.
المصدر: 2009 4th IEEE Conference on Industrial Electronics and Applications Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on. :3319-3322 May, 2009
Relation: 2009 4th IEEE Conference on Industrial Electronics and Applications (ICIEA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424427994
9781424428007
تدمد:21562318
21582297
DOI:10.1109/ICIEA.2009.5138817