مؤتمر
Monitoring multi-stage sequential manufacturing processes: a Bayesian approach
| العنوان: | Monitoring multi-stage sequential manufacturing processes: a Bayesian approach |
|---|---|
| المؤلفون: | Rao, S., Strojwas, A., Lehoczky, J., Schervish, M. |
| المصدر: | Proceedings of International Symposium on Semiconductor Manufacturing Semiconductor manufacturing Semiconductor Manufacturing, 1995., IEEE/UCS/SEMI International Symposium on. :182-186 1995 |
| Relation: | Proceedings of International Symposium on Semiconductor Manufacturing |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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