مؤتمر
Integrity of gate oxide on TFSOI materials
| العنوان: | Integrity of gate oxide on TFSOI materials |
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| المؤلفون: | Hong, S.O., Wetteroth, T., Shin, H., Wilson, S.R., Huang, W.M., Foerstner, J., Racanelli, M., Shin, H.C., Hwang, B.-Y., Schroder, D.K. |
| المصدر: | 1995 IEEE International SOI Conference Proceedings SOI conference SOI Conference, 1995. Proceedings., 1995 IEEE International. :22-23 1995 |
| Relation: | 1995 IEEE International SOI Conference Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780325478 9780780325470 |
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| DOI: | 10.1109/SOI.1995.526441 |