مؤتمر
Coping with re-usability using sequential ATPG: a practical case study
| العنوان: | Coping with re-usability using sequential ATPG: a practical case study |
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| المؤلفون: | van Sas, J., Huyskens, E., Naert, H., Schell, F., van de Goor, A. |
| المصدر: | Proceedings of 1995 IEEE International Test Conference (ITC) International test conference Test Conference, 1995. Proceedings., International. :252-261 1995 |
| Relation: | Proceedings of 1995 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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