مؤتمر
1D thickness scaling study of phase change material (Ge2Sb2Te5) using a pseudo 3-terminal device
| العنوان: | 1D thickness scaling study of phase change material (Ge2Sb2Te5) using a pseudo 3-terminal device |
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| المؤلفون: | Bae, Byoung-Jae, Kim, SangBum, Yuan Zhang, Youngkuk Kim, In-Gyu Baek, Soonoh Park, In-Seok Yeo, Siyoung Choi, Moon, Joo-Tae, Wong, H.-S. Philip, Kinam Kim |
| المصدر: | 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009 |
| Relation: | 2009 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424456406 9781424456390 9781424456413 |
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| تدمد: | 01631918 2156017X |
| DOI: | 10.1109/IEDM.2009.5424412 |