مؤتمر
The Influence of Technological Parameters on Ultra-Short Gate SI-NMOS Transistor Performances
| العنوان: | The Influence of Technological Parameters on Ultra-Short Gate SI-NMOS Transistor Performances |
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| المؤلفون: | Charef, M., Dessenne, F., Thobel, J.L., Baudry, L., Fauquembergue, R. |
| المصدر: | ESSDERC '93: 23rd European solid State Device Research Conference Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European. :625-628 Sep, 1993 |
| Relation: | Proceedings of the 23rd European Solid State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 2863321358 9782863321355 |
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| DOI: | 10.1007/978-3-7091-6657-4_75 |