مؤتمر
Statistical analysis of SRAM parametric failure under supply voltage scaling
| العنوان: | Statistical analysis of SRAM parametric failure under supply voltage scaling |
|---|---|
| المؤلفون: | Vatajelu, E. I., Figueras, J. |
| المصدر: | 2010 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) Automation Quality and Testing Robotics (AQTR), 2010 IEEE International Conference on. 2:1-6 May, 2010 |
| Relation: | 2010 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2010) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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