مؤتمر
Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures
| العنوان: | Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures |
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| المؤلفون: | Boyer, Ludovic, Rousset, Bernard, Notingher Jr., Petru, Agnel, Serge, Sanchez, Jean-Louis |
| المصدر: | 2010 IEEE Industry Applications Society Annual Meeting Industry Applications Society Annual Meeting (IAS), 2010 IEEE. :1-8 Oct, 2010 |
| Relation: | 2010 IEEE Industry Applications Society Annual Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424463930 9781424463947 9781424463954 |
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| تدمد: | 01972618 |
| DOI: | 10.1109/IAS.2010.5614500 |