مؤتمر
Optimal single probe traversal algorithm for testing of MCM substrate
| العنوان: | Optimal single probe traversal algorithm for testing of MCM substrate |
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| المؤلفون: | Pendurkar, R., Chatterjee, A., Tovey, C. |
| المصدر: | Proceedings International Conference on Computer Design. VLSI in Computers and Processors Computer design: VLSI in computers and processors Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on. :396-401 1996 |
| Relation: | Proceedings International Conference on Computer Design. VLSI in Computers and Processors |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818675543 9780818675546 |
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| تدمد: | 10636404 |
| DOI: | 10.1109/ICCD.1996.563585 |