دورية أكاديمية
Robust System Design to Overcome CMOS Reliability Challenges
| العنوان: | Robust System Design to Overcome CMOS Reliability Challenges |
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| المؤلفون: | Mitra, S., Brelsford, K., Kim, Y. M., Lee, H.-H. K., Li, Y. |
| المصدر: | IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 1(1):30-41 Mar, 2011 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21563357 21563365 |
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| DOI: | 10.1109/JETCAS.2011.2135630 |