مؤتمر
Study of threshold voltage modeling for small-scaled strained Si nMOSFET
| العنوان: | Study of threshold voltage modeling for small-scaled strained Si nMOSFET |
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| المؤلفون: | Qu Jiang-Tao, He-Ming, Zhang, Qin Shan-Shan, Xu Xiao-Bo, Hui-Yong, Hu |
| المصدر: | 2011 International Conference on Electric Information and Control Engineering Electric Information and Control Engineering (ICEICE), 2011 International Conference on. :4507-4510 Apr, 2011 |
| Relation: | 2011 International Conference on Electric Information and Control Engineering (ICEICE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424480364 9781424480388 9781424480395 |
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| DOI: | 10.1109/ICEICE.2011.5777280 |