مؤتمر
Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis
العنوان: | Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis |
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المؤلفون: | Gaojie Wen, Binghai Liu, Winter Wang, Jinglong Li, Li Tian, Xuezhu Wang |
المصدر: | 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-4 Jul, 2011 |
Relation: | 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457701597 9781457701580 |
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تدمد: | 19461542 19461550 |
DOI: | 10.1109/IPFA.2011.5992737 |