مؤتمر
Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation
| العنوان: | Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation |
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| المؤلفون: | Jaworski, Z., Niewczas, M., Kuzmicz, W. |
| المصدر: | Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) VLSI test VLSI Test Symposium, 1997., 15th IEEE. :172-176 1997 |
| Relation: | Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818678100 9780818678103 |
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| تدمد: | 10930167 |
| DOI: | 10.1109/VTEST.1997.600249 |