مؤتمر
Unaccelerated reliability testing for T/R modules: need, methodology and supporting data
| العنوان: | Unaccelerated reliability testing for T/R modules: need, methodology and supporting data |
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| المؤلفون: | Kopp, B.A., Axness, T.A., Moore, C.R. |
| المصدر: | 1997 IEEE MTT-S International Microwave Symposium Digest Microwave symposium Microwave Symposium Digest, 1997., IEEE MTT-S International. 2:583-586 vol.2 1997 |
| Relation: | 1997 IEEE MTT-S International Microwave Symposium Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780338146 9780780338142 |
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| تدمد: | 0149645X |
| DOI: | 10.1109/MWSYM.1997.602860 |