مؤتمر
Online Fault Detection in Reversible Logic
العنوان: | Online Fault Detection in Reversible Logic |
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المؤلفون: | Nayeem, N.M., Rice, J.E. |
المصدر: | 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on. :426-434 Oct, 2011 |
Relation: | 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781457717130 |
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تدمد: | 15505774 23777966 |
DOI: | 10.1109/DFT.2011.55 |