Online Fault Detection in Reversible Logic

التفاصيل البيبلوغرافية
العنوان: Online Fault Detection in Reversible Logic
المؤلفون: Nayeem, N.M., Rice, J.E.
المصدر: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on. :426-434 Oct, 2011
Relation: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781457717130
تدمد:15505774
23777966
DOI:10.1109/DFT.2011.55