مؤتمر
Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications
| العنوان: | Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications |
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| المؤلفون: | Fujita, K., Torii, Y., Hori, M., Oh, J., Shifren, L., Ranade, P., Nakagawa, M., Okabe, K., Miyake, T., Ohkoshi, K., Kuramae, M., Mori, T., Tsuruta, T., Thompson, S., Ema, T. |
| المصدر: | 2011 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2011 IEEE International. :32.3.1-32.3.4 Dec, 2011 |
| Relation: | 2011 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457705045 9781457705069 9781457705052 |
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| تدمد: | 01631918 2156017X |
| DOI: | 10.1109/IEDM.2011.6131657 |