مؤتمر
Cell-aware analysis for small-delay effects and production test results from different fault models
| العنوان: | Cell-aware analysis for small-delay effects and production test results from different fault models |
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| المؤلفون: | Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J. |
| المصدر: | 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-8 Sep, 2011 |
| Relation: | 2011 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781457701535 9781457701511 9781457701528 |
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| تدمد: | 10893539 23782250 |
| DOI: | 10.1109/TEST.2011.6139151 |