مؤتمر
Investigation on hump effects of L-shaped tunneling filed-effect transistors
| العنوان: | Investigation on hump effects of L-shaped tunneling filed-effect transistors |
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| المؤلفون: | Kim, Sang Wan, Choi, Woo Young, Kim, Hyungjin, Sun, Min-Chul, Kim, Hyun Woo, Park, Byung-Gook |
| المصدر: | 2012 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2012 IEEE. :1-2 Jun, 2012 |
| Relation: | 2012 IEEE Silicon Nanoelectronics Workshop (SNW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467309950 9781467309967 9781467309974 |
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| تدمد: | 21614636 21614644 |
| DOI: | 10.1109/SNW.2012.6243306 |