Investigation on hump effects of L-shaped tunneling filed-effect transistors

التفاصيل البيبلوغرافية
العنوان: Investigation on hump effects of L-shaped tunneling filed-effect transistors
المؤلفون: Kim, Sang Wan, Choi, Woo Young, Kim, Hyungjin, Sun, Min-Chul, Kim, Hyun Woo, Park, Byung-Gook
المصدر: 2012 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2012 IEEE. :1-2 Jun, 2012
Relation: 2012 IEEE Silicon Nanoelectronics Workshop (SNW)
قاعدة البيانات: IEEE Xplore Digital Library