مؤتمر
Fast noise prediction for process optimization using only standard DC and S-parameter measurements
| العنوان: | Fast noise prediction for process optimization using only standard DC and S-parameter measurements |
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| المؤلفون: | Gridelet, E., Scholten, A. J., Klaassen, D. B. M., van Dalen, R., Pijper, R., Magnee, P. H. C, Tiemeijer, L. F., Dinh, V. T., Vanhoucke, T. |
| المصدر: | 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2012 IEEE. :1-4 Sep, 2012 |
| Relation: | 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467330206 9781467330190 9781467330213 |
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| تدمد: | 10889299 2378590X |
| DOI: | 10.1109/BCTM.2012.6352637 |