Thermal Annealing induced relaxation of compressive strain in porous GaN structures

التفاصيل البيبلوغرافية
العنوان: Thermal Annealing induced relaxation of compressive strain in porous GaN structures
المؤلفون: Slimane, Ahmed B., Najar, Adel, Ng, Tien K., Ooi, Boon S.
المصدر: IEEE Photonics Conference 2012 Photonics Conference (IPC), 2012 IEEE. :921-922 Sep, 2012
Relation: 2012 IEEE Photonics Conference (IPC)
قاعدة البيانات: IEEE Xplore Digital Library