مؤتمر
Cell-aware Production test results from a 32-nm notebook processor
العنوان: | Cell-aware Production test results from a 32-nm notebook processor |
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المؤلفون: | Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J. |
المصدر: | 2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-9 Nov, 2012 |
Relation: | 2012 IEEE International Test Conference (ITC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467315944 9781467315937 9781467315951 |
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تدمد: | 10893539 23782250 |
DOI: | 10.1109/TEST.2012.6401533 |