مؤتمر
Comprehensive study of interface passivation in Ge-MOSFETs — Control the interfacial layer for high performance devices
العنوان: | Comprehensive study of interface passivation in Ge-MOSFETs — Control the interfacial layer for high performance devices |
---|---|
المؤلفون: | Wang, Sheng Kai, Xue, Bai-Qing, Sun, Bing, Liang, Hui-Li, Mei, Zeng-Xia, Zhao, Wei, Du, Xiao-Long, Liu, Hong-Gang |
المصدر: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on. :1-3 Oct, 2012 |
Relation: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467324748 9781467324731 9781467324755 |
---|---|
DOI: | 10.1109/ICSICT.2012.6467608 |