مؤتمر
Comprehensive study of interface passivation in Ge-MOSFETs — Control the interfacial layer for high performance devices
| العنوان: | Comprehensive study of interface passivation in Ge-MOSFETs — Control the interfacial layer for high performance devices |
|---|---|
| المؤلفون: | Wang, Sheng Kai, Xue, Bai-Qing, Sun, Bing, Liang, Hui-Li, Mei, Zeng-Xia, Zhao, Wei, Du, Xiao-Long, Liu, Hong-Gang |
| المصدر: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on. :1-3 Oct, 2012 |
| Relation: | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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