Ultra-thin EBL (encapsulated barrier layer) for ferroelectric capacitor

التفاصيل البيبلوغرافية
العنوان: Ultra-thin EBL (encapsulated barrier layer) for ferroelectric capacitor
المؤلفون: In Seon park, Yeong Kwan Kim, Sang Min Lee, Ju Hyuck Chung, Sang Bom Kang, Chang Soo Park, Cha Young Yoo, Sang In Lee, Moon Yong Lee
المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :617-620 1997
Relation: International Electron Devices Meeting. IEDM Technical Digest
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780341007
9780780341005
تدمد:01631918
DOI:10.1109/IEDM.1997.650460