مؤتمر
Numerical study on impact of mechanical stress in the regions of high current density in N-Type MOS devices
| العنوان: | Numerical study on impact of mechanical stress in the regions of high current density in N-Type MOS devices |
|---|---|
| المؤلفون: | Koganemaru, Masaaki, Tada, Naohiro, Ikeda, Toru, Miyazaki, Noriyuki, Tomokage, Hajime |
| المصدر: | 2012 4th Electronic System-Integration Technology Conference Electronic System-Integration Technology Conference (ESTC), 2012 4th. :1-6 Sep, 2012 |
| Relation: | 2012 4th Electronic System-Integration Technology Conference (ESTC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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