مؤتمر
Model-based automated testing of critical PLC programs
| العنوان: | Model-based automated testing of critical PLC programs |
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| المؤلفون: | Fernandez Adiego, B., Blanco Vinuela, E., Tournier, J.-C., Suarez, V.M.G., Bliudze, S. |
| المصدر: | 2013 11th IEEE International Conference on Industrial Informatics (INDIN) Industrial Informatics (INDIN), 2013 11th IEEE International Conference on. :722-727 Jul, 2013 |
| Relation: | 2013 IEEE 11th International Conference on Industrial Informatics (INDIN) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479907526 |
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| تدمد: | 19354576 2378363X |
| DOI: | 10.1109/INDIN.2013.6622973 |