مؤتمر
Model-based automated testing of critical PLC programs
العنوان: | Model-based automated testing of critical PLC programs |
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المؤلفون: | Fernandez Adiego, B., Blanco Vinuela, E., Tournier, J.-C., Suarez, V.M.G., Bliudze, S. |
المصدر: | 2013 11th IEEE International Conference on Industrial Informatics (INDIN) Industrial Informatics (INDIN), 2013 11th IEEE International Conference on. :722-727 Jul, 2013 |
Relation: | 2013 IEEE 11th International Conference on Industrial Informatics (INDIN) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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