مؤتمر
Total Ionizing Dose Characterization of the Calibration Circuit of Texas Instruments' ADC12D1600CCMLS, 12b, 3.2 GSPS Analog-to-Digital Converter
العنوان: | Total Ionizing Dose Characterization of the Calibration Circuit of Texas Instruments' ADC12D1600CCMLS, 12b, 3.2 GSPS Analog-to-Digital Converter |
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المؤلفون: | Kruckmeyer, Kirby, Trinh, Thang, Park, Linton |
المصدر: | 2013 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2013 IEEE. :1-4 Jul, 2013 |
Relation: | 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479911363 9781479911370 9781479911394 |
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تدمد: | 21540519 21540535 |
DOI: | 10.1109/REDW.2013.6658222 |