مؤتمر
Lifetime of CMOS circuits evaluation by means of electro-thermal simulations
| العنوان: | Lifetime of CMOS circuits evaluation by means of electro-thermal simulations |
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| المؤلفون: | Garci, Maroua, Kammerer, Jean-Baptiste, Hebrard, Luc |
| المصدر: | 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on. :122-126 Sep, 2013 |
| Relation: | 2013 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479922710 9781479922727 |
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| DOI: | 10.1109/THERMINIC.2013.6675213 |