مؤتمر
Application of construction analysis in MMIC device intrinsic reliability evaluating
| العنوان: | Application of construction analysis in MMIC device intrinsic reliability evaluating |
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| المؤلفون: | Xin, Liu, Wenxiao, Fang |
| المصدر: | 2013 14th International Conference on Electronic Packaging Technology Electronic Packaging Technology (ICEPT), 2013 14th International Conference on. :1070-1072 Aug, 2013 |
| Relation: | 2013 14th International Conference on Electronic Packaging Technology (ICEPT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479904983 |
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| DOI: | 10.1109/ICEPT.2013.6756644 |