Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs

التفاصيل البيبلوغرافية
العنوان:	Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs
المؤلفون:	Goel, Sandeep Kumar, Min-Jer-Wang, Adham, Saman, Mehta, Ashok, Lee, Frank
المصدر:	Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on. :1-4 Apr, 2014
Relation:	2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	9781479927760
DOI:	10.1109/VLSI-DAT.2014.6834918