مؤتمر
On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial)
| العنوان: | On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial) |
|---|---|
| المؤلفون: | Indaco, Marco, Prinetto, Paolo, Vatajelu, Elena I. |
| المصدر: | 2014 19th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2014 19th IEEE European. :1-10 May, 2014 |
| Relation: | 2014 19th IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479934157 |
|---|---|
| تدمد: | 15301877 15581780 |
| DOI: | 10.1109/ETS.2014.6847813 |