مؤتمر
In situ biasing TEM investigation of resistive switching events in TiO2-based RRAM
| العنوان: | In situ biasing TEM investigation of resistive switching events in TiO2-based RRAM |
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| المؤلفون: | Jonghan Kwon, Picard, Yoosuf N., Skowronski, Marek, Sharma, Abhishek A., Bain, James A. |
| المصدر: | 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :5E.5.1-5E.5.5 Jun, 2014 |
| Relation: | 2014 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479933174 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2014.6860680 |