التفاصيل البيبلوغرافية
العنوان: |
Acceleration factor analysis of aging test on gallium nitride (GaN)-based high power light-emitting diode (LED) |
المؤلفون: |
Yu-Hsiang Yang, Su, Yen-Fu, Chiang, Kuo-Ning |
المصدر: |
Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on. :178-181 May, 2014 |
Relation: |
2014 IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) |
قاعدة البيانات: |
IEEE Xplore Digital Library |