Acceleration factor analysis of aging test on gallium nitride (GaN)-based high power light-emitting diode (LED)

التفاصيل البيبلوغرافية
العنوان: Acceleration factor analysis of aging test on gallium nitride (GaN)-based high power light-emitting diode (LED)
المؤلفون: Yu-Hsiang Yang, Su, Yen-Fu, Chiang, Kuo-Ning
المصدر: Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on. :178-181 May, 2014
Relation: 2014 IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479952670
تدمد:10879870
DOI:10.1109/ITHERM.2014.6892278