التفاصيل البيبلوغرافية
| العنوان: |
Total ionizing dose effects in high breakdown voltage SOI devices |
| المؤلفون: |
Zhongjian Wang, Xinhong Cheng, Chao Xia, Dawei Xu, Lingyan Shen, Duo Cao, Li Zheng, Qian Wang, Yuehui Yu |
| المصدر: |
2014 20th International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2014 20th International Conference on. :1-4 Jun, 2014 |
| Relation: |
2014 20th International Conference on Ion Implantation Technology (IIT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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